OpenID and the Enterprise:  a model-based analysis of single sign-on authentication

Jacob Bellamy-McIntyre, Christof Lutteroth, Gerald Weber

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

9 Citations (SciVal)

Original language	English
Title of host publication	Proceedings of the 15th IEEE International Enterprise Distributed Object Computing Conference (EDOC), 2011
Publisher	IEEE
Pages	129-138
Number of pages	10
ISBN (Print)	9781457703621
DOIs	https://doi.org/10.1109/EDOC.2011.26
Publication status	Published - 2011

Access to Document

OpenID and the Enterprise: a model-based analysis of single sign-on authentication. / Bellamy-McIntyre, Jacob; Lutteroth, Christof; Weber, Gerald.
Proceedings of the 15th IEEE International Enterprise Distributed Object Computing Conference (EDOC), 2011. IEEE, 2011. p. 129-138.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

@inproceedings{b4659cc68c124480b357517421e93e70,

title = "OpenID and the Enterprise: a model-based analysis of single sign-on authentication",

author = "Jacob Bellamy-McIntyre and Christof Lutteroth and Gerald Weber",

year = "2011",

doi = "10.1109/EDOC.2011.26",

language = "English",

isbn = "9781457703621 ",

pages = "129--138",

booktitle = "Proceedings of the 15th IEEE International Enterprise Distributed Object Computing Conference (EDOC), 2011",

publisher = "IEEE",

address = "USA United States",

}

TY - GEN

T1 - OpenID and the Enterprise

T2 - a model-based analysis of single sign-on authentication

AU - Bellamy-McIntyre, Jacob

AU - Lutteroth, Christof

AU - Weber, Gerald

PY - 2011

Y1 - 2011

UR - http://dx.doi.org/ 10.1109/EDOC.2011.26

U2 - 10.1109/EDOC.2011.26

DO - 10.1109/EDOC.2011.26

M3 - Chapter in a published conference proceeding

SN - 9781457703621

SP - 129

EP - 138

BT - Proceedings of the 15th IEEE International Enterprise Distributed Object Computing Conference (EDOC), 2011

PB - IEEE

ER -