OpAmp design for lock-in amplifiers in portable sensing systems: 2013 European Conference on Circuit Theory and Design (ECCTD)

M. R. Valero, S. Celma, N. Medrano, B. Calvo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This paper presents a 1.2 V low-power rail-to-rail class AB operational amplifier (OpAmp) suitable for integrated lock-in amplifiers. The proposed OpAmp has been designed in a standard 0.18 μm CMOS technology. For a 1.2 V single supply and 81 μW power consumption, simulations shows a 86 dB open loop gain, 56o phase margin, 17 MHz unity gain frequency with 1 pF load and 97 dB CMRR. Adaptive biasing provides 33 V/μs slew-rate for a 1 pF capacitive load. A compact and reliable lock-in amplifier (LIA) has been designed using the proposed circuit. Post-layout results for noisy signals confirm the capability of the LIA to effectively recover information from signal-to-noise ratios down to -26 dB with errors below 4.2% up to 50 kHz and a power consumption of only 675 μW
Original languageEnglish
Title of host publication2013 European Conference on Circuit Theory and Design (ECCTD)
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Electronic)978-3-00-0043785-4
DOIs
Publication statusPublished - 8 Sep 2013

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Keywords

  • CMOS integrated circuits
  • low-power electronics
  • operational amplifiers
  • CMOS technology
  • LIA
  • adaptive biasing
  • capacitance 1 pF
  • class AB amplifier operational amplifier design
  • gain 86 dB
  • integrated lock-in amplifiers
  • portable sensing systems
  • power 675 muW
  • power 81 muW
  • signal-to-noise ratio
  • size 0.18 mum
  • voltage 1.2 V
  • Gain
  • Logic gates
  • Mixers
  • Operational amplifiers
  • Power demand
  • Transistors

Cite this

Valero, M. R., Celma, S., Medrano, N., & Calvo, B. (2013). OpAmp design for lock-in amplifiers in portable sensing systems: 2013 European Conference on Circuit Theory and Design (ECCTD). In 2013 European Conference on Circuit Theory and Design (ECCTD) (pp. 1-4). IEEE. https://doi.org/10.1109/ECCTD.2013.6662283