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On the importance of the Vg,max-Vth parameter on LTPS TFT stressing behavior

  • Despina C. Moschou
  • , Giannis P. Kontogiannopoulos
  • , Dimitrios N. Kouvatsos
  • , Apostolos T. Voutsas
  • National Centre for Scientific Research “Demokritos”
  • Sharp Labs of America

Research output: Contribution to journal › Article › peer-review

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