Abstract
A new timing measurement architecture based on the time-to-digital conversion technique is presented. The architecture occupies a small silicon area (200x185um) in a 0.12um CMOS Process and can achieve tens of femtoseconds timing resolution, which is the highest reported to date.
Original language | Undefined/Unknown |
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Pages (from-to) | 528-530 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 42 |
Issue number | 9 |
Publication status | Published - 1 Apr 2006 |