Observation of vacancy defects at silicon grain boundaries formed via suppressed solid phase epitaxy

K J Dudeck, W D Walters, A P Knights, Paul Coleman

Research output: Contribution to journalArticlepeer-review

1 Citation (SciVal)
Original languageEnglish
Article number055102
JournalJournal of Physics D: Applied Physics
Issue number5
Publication statusPublished - 2008

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