Numerical study of the influence of the encapsulation layer on the DC over-current performance of HTS coated conductors

Jiabin Yang, Jun Ma, Chao Li, Yavuz Ozturk, James Gawith, Boyang Shen, Tim Coombs

Research output: Contribution to journalArticlepeer-review

4 Citations (SciVal)

Abstract

The application of resistive superconducting fault current limiters (R-SFCLs) in voltage source converter (VSC)-based DC systems has been proposed, and the encapsulated high temperature coated conductors (HTS-CCs) used for R-SFCLs is getting practical. Thus, this paper respectively develops a 1-D HTS-CC model and a 2-D HTS-CC model with different thicknesses to investigate the resistance characteristics and the quench recovery time. The results show that the resistance of encapsulated HTS-CCs goes through the flux flow state before reaching the normal. Then, the encapsulation can expand the limit of fault current, and a suitable thickness is likely to reduce the total resistance of the R-FCL. Finally, due to the existence of the heat transfer between the HTS-CC surface and the liquid nitrogen bath, a thinner tape might recover faster, and the recovery time tends to rise slowly as the tolerated current increases.

Original languageEnglish
Article number9000511
JournalIEEE Transactions on Applied Superconductivity
Volume30
Issue number4
DOIs
Publication statusPublished - 17 Feb 2020

Bibliographical note

Publisher Copyright:
© 2002-2011 IEEE.

Keywords

  • 1-D HTS-CC model
  • 2-D HTS-CC model
  • encapsulation
  • R-SFCL
  • recovery time
  • resistance
  • VSC-based DC system

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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