Numerical and experimental analysis of Ic and AC loss for bent 2G HTS wires used in an electric machine

R Pei, A Velichko, Z Hong, Y Jiang, Weijia Yuan, A M Campbell, T A Coombs

Research output: Contribution to journalArticlepeer-review

12 Citations (SciVal)

Fingerprint

Dive into the research topics of 'Numerical and experimental analysis of Ic and AC loss for bent 2G HTS wires used in an electric machine'. Together they form a unique fingerprint.

Material Science