Nonuniform image patch exemplars for low level vision

Vincent De Smet, Luc Van Gool, Vinay P. Namboodiri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper we propose the use of nonuniformly resized image patch exemplars for solving low level vision problems like denoising and super-resolution. While patch-based methods have been shown to be successful for several such applications, these methods have so far assumed uniform sizes for image patches. In this paper we address this restriction. We use an integral image representation for efficient computation of the matching cost for variable-sized patches. We show that nonuniform image patch exemplars are useful in improving classic techniques for nonlocal means-based denoising and example-based superresolution. We provide refinement cues to further improve the patch size estimation. This method can be adopted for a large number of related methods and applications due to its simplicity and generality.

Original languageEnglish
Title of host publication2013 IEEE Workshop on Applications of Computer Vision, WACV 2013
Pages23-30
Number of pages8
DOIs
Publication statusPublished - 4 Apr 2013
Event2013 IEEE Workshop on Applications of Computer Vision, WACV 2013 - Clearwater Beach, FL, USA United States
Duration: 15 Jan 201317 Jan 2013

Publication series

NameProceedings of IEEE Workshop on Applications of Computer Vision
ISSN (Print)2158-3978
ISSN (Electronic)2158-3986

Conference

Conference2013 IEEE Workshop on Applications of Computer Vision, WACV 2013
CountryUSA United States
CityClearwater Beach, FL
Period15/01/1317/01/13

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Computer Science Applications

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