Nonuniform image patch exemplars for low level vision

Vincent De Smet; Luc Van Gool; Vinay P. Namboodiri

doi:10.1109/WACV.2013.6474995

Nonuniform image patch exemplars for low level vision

Vincent De Smet, Luc Van Gool, Vinay P. Namboodiri

Department of Computer Science

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

3 Citations (SciVal)

Abstract

In this paper we propose the use of nonuniformly resized image patch exemplars for solving low level vision problems like denoising and super-resolution. While patch-based methods have been shown to be successful for several such applications, these methods have so far assumed uniform sizes for image patches. In this paper we address this restriction. We use an integral image representation for efficient computation of the matching cost for variable-sized patches. We show that nonuniform image patch exemplars are useful in improving classic techniques for nonlocal means-based denoising and example-based superresolution. We provide refinement cues to further improve the patch size estimation. This method can be adopted for a large number of related methods and applications due to its simplicity and generality.

Original language	English
Title of host publication	2013 IEEE Workshop on Applications of Computer Vision, WACV 2013
Pages	23-30
Number of pages	8
DOIs	https://doi.org/10.1109/WACV.2013.6474995
Publication status	Published - 4 Apr 2013
Event	2013 IEEE Workshop on Applications of Computer Vision, WACV 2013 - Clearwater Beach, FL, USA United States Duration: 15 Jan 2013 → 17 Jan 2013

Publication series

Name	Proceedings of IEEE Workshop on Applications of Computer Vision
ISSN (Print)	2158-3978
ISSN (Electronic)	2158-3986

Conference

Conference	2013 IEEE Workshop on Applications of Computer Vision, WACV 2013
Country/Territory	USA United States
City	Clearwater Beach, FL
Period	15/01/13 → 17/01/13

ASJC Scopus subject areas

Computer Vision and Pattern Recognition
Computer Science Applications

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10.1109/WACV.2013.6474995

Cite this

Nonuniform image patch exemplars for low level vision. / De Smet, Vincent; Van Gool, Luc; Namboodiri, Vinay P.
2013 IEEE Workshop on Applications of Computer Vision, WACV 2013. 2013. p. 23-30 6474995 (Proceedings of IEEE Workshop on Applications of Computer Vision).

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

De Smet, V, Van Gool, L & Namboodiri, VP 2013, Nonuniform image patch exemplars for low level vision. in 2013 IEEE Workshop on Applications of Computer Vision, WACV 2013., 6474995, Proceedings of IEEE Workshop on Applications of Computer Vision, pp. 23-30, 2013 IEEE Workshop on Applications of Computer Vision, WACV 2013, Clearwater Beach, FL, USA United States, 15/01/13. https://doi.org/10.1109/WACV.2013.6474995

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author = "{De Smet}, Vincent and {Van Gool}, Luc and Namboodiri, {Vinay P.}",

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AB - In this paper we propose the use of nonuniformly resized image patch exemplars for solving low level vision problems like denoising and super-resolution. While patch-based methods have been shown to be successful for several such applications, these methods have so far assumed uniform sizes for image patches. In this paper we address this restriction. We use an integral image representation for efficient computation of the matching cost for variable-sized patches. We show that nonuniform image patch exemplars are useful in improving classic techniques for nonlocal means-based denoising and example-based superresolution. We provide refinement cues to further improve the patch size estimation. This method can be adopted for a large number of related methods and applications due to its simplicity and generality.

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Nonuniform image patch exemplars for low level vision

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