Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy: ORCID logo ; B. Starosta ORCID logo ; B. Hourahine ORCID logo ; R. W. Martin ORCID logo ; C. Trager-Cowan ORCID logo

G. Naresh-Kumar, P. R. Edwards, T. Batten, M. Nouf-Allehiani, A. Vilalta-Clemente, A. J. Wilkinson, E. Le Boulbar, P. A. Shields, B. Starosta, B. Hourahine, R. W. Martin, C. Trager-Cowan