Shot noise in vertical cavity surface emitting lasers has been investigated using a large signal rate equation model. The results are in good agreement with experiment and show that optical saturation due to focusing effects limits the noise floor. Additionally, transverse mode interaction causes kinks in the L-I-curve, leading to increases in the low frequency RIN of up to 15dB.
- Semiconductor device noise
- Vertical cavity surface emitting lasers
ASJC Scopus subject areas
- Electrical and Electronic Engineering