Fingerprint
Dive into the research topics of 'Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
AM Korsunsky, E Salvati, AGJ Lunt, Tan Sui, MZ Mughal, R Daniel, J Keckes, E Bemporad, M Sebastiani
Research output: Contribution to journal › Article › peer-review
61
Citations
(SciVal)
96
Downloads
(Pure)