Nanocrystalline Si studied by beam-based positron annihilation spectroscopy

P G Coleman, X D Pi, R M Gwilliam, B J Sealy

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationPositron Annihilation - Icpa-13, Proceedings
Pages66-68
Number of pages3
Volume445-4
Publication statusPublished - 2004

Publication series

NameMaterials Science Forum

Cite this

Coleman, P. G., Pi, X. D., Gwilliam, R. M., & Sealy, B. J. (2004). Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. In Positron Annihilation - Icpa-13, Proceedings (Vol. 445-4, pp. 66-68). (Materials Science Forum).

Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. / Coleman, P G; Pi, X D; Gwilliam, R M; Sealy, B J.

Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4 2004. p. 66-68 (Materials Science Forum).

Research output: Chapter in Book/Report/Conference proceedingChapter

Coleman, PG, Pi, XD, Gwilliam, RM & Sealy, BJ 2004, Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. in Positron Annihilation - Icpa-13, Proceedings. vol. 445-4, Materials Science Forum, pp. 66-68.
Coleman PG, Pi XD, Gwilliam RM, Sealy BJ. Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. In Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. 2004. p. 66-68. (Materials Science Forum).
Coleman, P G ; Pi, X D ; Gwilliam, R M ; Sealy, B J. / Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4 2004. pp. 66-68 (Materials Science Forum).
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