Nanocrystalline Si studied by beam-based positron annihilation spectroscopy

P G Coleman, X D Pi, R M Gwilliam, B J Sealy

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationPositron Annihilation - Icpa-13, Proceedings
Pages66-68
Number of pages3
Volume445-4
Publication statusPublished - 2004

Publication series

NameMaterials Science Forum

Cite this

Coleman, P. G., Pi, X. D., Gwilliam, R. M., & Sealy, B. J. (2004). Nanocrystalline Si studied by beam-based positron annihilation spectroscopy. In Positron Annihilation - Icpa-13, Proceedings (Vol. 445-4, pp. 66-68). (Materials Science Forum).