TY - JOUR
T1 - Multiple-data-set Rietveld analysis using isotopes in powder neutron diffraction. I. Accurate determination of the doping level in the ternary system NixMg1-xO, 0.005 < x < 0.1
AU - Henry, P.F.
AU - Weller, M.T.
AU - Wilson, C.C.
PY - 2001/1/1
Y1 - 2001/1/1
N2 - The use of isotopes to extract precise and very accurate structural information in complex Rietveld analysis has been demonstrated by comparison of results obtained for single-data-set analysis with those from multiple-data-set single-crystallographic-model analysis of NixMg1-xO doped with various nickel isotopes. Fractional occupancies of dopants can be accurately determined down to at least the 0.5% doping level, which cannot be obtained through single-sample-data-set refinements because of correlation effects, even when a large contrast exists between the nickel isotope used and magnesium.
AB - The use of isotopes to extract precise and very accurate structural information in complex Rietveld analysis has been demonstrated by comparison of results obtained for single-data-set analysis with those from multiple-data-set single-crystallographic-model analysis of NixMg1-xO doped with various nickel isotopes. Fractional occupancies of dopants can be accurately determined down to at least the 0.5% doping level, which cannot be obtained through single-sample-data-set refinements because of correlation effects, even when a large contrast exists between the nickel isotope used and magnesium.
UR - http://www.scopus.com/inward/record.url?scp=0035121551&partnerID=8YFLogxK
UR - http://dx.doi.org/10.1107/S002188980001582X
U2 - 10.1107/S002188980001582X
DO - 10.1107/S002188980001582X
M3 - Article
AN - SCOPUS:0035121551
SN - 0021-8898
VL - 34
SP - 42
EP - 46
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
IS - 1
ER -