Multi-beam engineering microscopy - A versatile tool for optimal materials design

Alexander M. Korsunsky; Tan Sui; Jiří Dluhoš; Siqi Ying; Alexander J.G. Lunt; Bohang Song; Enrico Salvati; Hongjia Zhang; Taehoon Kim; Sergei M. Kreynin

Multi-beam engineering microscopy - A versatile tool for optimal materials design

Alexander M. Korsunsky, Tan Sui, Jiří Dluhoš, Siqi Ying, Alexander J.G. Lunt, Bohang Song, Enrico Salvati, Hongjia Zhang, Taehoon Kim, Sergei M. Kreynin

Department of Mechanical Engineering

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

1 Citation (SciVal)

70 Downloads (Pure)

Abstract

Engineering microscopy is a term we use to refer to a suite of versatile techniques for spatially resolved characterisation of material structure and properties for the purpose of optimising design, performance and durability of structures and technological systems. The range of tools that can be used for this purpose includes beams of photons (including X-rays), electrons, neutrons, and ions. Different modes of imaging include absorption and emission, spectroscopy, and scattering that can be used in full field or scanning regimes. The approaches that collect information in the form of 2D images can also be extended to 3D characterisation by serial sectioning or reconstruction tomography. An important additional mode of near-surface property evaluation arises through the use of nanoscale contact tip sensors, such as AFM, nanoindentation, electrochemical probes, etc. Crucial underpinning for multi-beam microscopic characterization is provided by multi-scale materials modelling. The lecture will provide an overview of flavours of engineering microscopy and highlight the exciting opportunities presented by the combination of techniques in the form of so-called correlative microscopy. Examples of multi-modal correlative microscopy will include partially stabilized zirconia, biomaterials such as flax fibres and human dental tissues, and also advanced engineering alloys and ceramics″.

Original language	English
Title of host publication	IMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015
Editors	David Dagan Feng, S. I. Ao, Craig Douglas, S. I. Ao, Craig Douglas, Jeong-A Lee, S. I. Ao, Oscar Castillo
Publisher	Newswood Limited
Pages	746-749
Number of pages	4
Volume	2
ISBN (Electronic)	9789881925398
Publication status	Published - 1 Jan 2015
Event	International MultiConference of Engineers and Computer Scientists 2015, IMECS 2015 - Tsimshatsui, Kowloon, Hong Kong Duration: 18 Mar 2015 → 20 Mar 2015

Conference

Conference	International MultiConference of Engineers and Computer Scientists 2015, IMECS 2015
Country/Territory	Hong Kong
City	Tsimshatsui, Kowloon
Period	18/03/15 → 20/03/15

Keywords

FIB-SEM microscopy
Raman spectroscopy
SiC fibre

ASJC Scopus subject areas

Computer Science (miscellaneous)

Access to Document

AS2894798111907941446028774150_content_1Accepted author manuscript, 2.29 MB

Cite this

Korsunsky, A. M., Sui, T., Dluhoš, J., Ying, S., Lunt, A. J. G., Song, B., Salvati, E., Zhang, H., Kim, T., & Kreynin, S. M. (2015). Multi-beam engineering microscopy - A versatile tool for optimal materials design. In D. D. Feng, S. I. Ao, C. Douglas, S. I. Ao, C. Douglas, J.-A. Lee, S. I. Ao, & O. Castillo (Eds.), IMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015 (Vol. 2, pp. 746-749). Newswood Limited.

Multi-beam engineering microscopy - A versatile tool for optimal materials design. / Korsunsky, Alexander M.; Sui, Tan; Dluhoš, Jiří et al.
IMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015. ed. / David Dagan Feng; S. I. Ao; Craig Douglas; S. I. Ao; Craig Douglas; Jeong-A Lee; S. I. Ao; Oscar Castillo. Vol. 2 Newswood Limited, 2015. p. 746-749.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Korsunsky, AM, Sui, T, Dluhoš, J, Ying, S, Lunt, AJG, Song, B, Salvati, E, Zhang, H, Kim, T & Kreynin, SM 2015, Multi-beam engineering microscopy - A versatile tool for optimal materials design. in DD Feng, SI Ao, C Douglas, SI Ao, C Douglas, J-A Lee, SI Ao & O Castillo (eds), IMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015. vol. 2, Newswood Limited, pp. 746-749, International MultiConference of Engineers and Computer Scientists 2015, IMECS 2015, Tsimshatsui, Kowloon, Hong Kong, 18/03/15.

Korsunsky, Alexander M. ; Sui, Tan ; Dluhoš, Jiří et al. / Multi-beam engineering microscopy - A versatile tool for optimal materials design. IMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015. editor / David Dagan Feng ; S. I. Ao ; Craig Douglas ; S. I. Ao ; Craig Douglas ; Jeong-A Lee ; S. I. Ao ; Oscar Castillo. Vol. 2 Newswood Limited, 2015. pp. 746-749

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ER -

Multi-beam engineering microscopy - A versatile tool for optimal materials design

Abstract

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Keywords

ASJC Scopus subject areas

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