Multi-beam engineering microscopy - A versatile tool for optimal materials design

Alexander M. Korsunsky, Tan Sui, Jiří Dluhoš, Siqi Ying, Alexander J.G. Lunt, Bohang Song, Enrico Salvati, Hongjia Zhang, Taehoon Kim, Sergei M. Kreynin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

Engineering microscopy is a term we use to refer to a suite of versatile techniques for spatially resolved characterisation of material structure and properties for the purpose of optimising design, performance and durability of structures and technological systems. The range of tools that can be used for this purpose includes beams of photons (including X-rays), electrons, neutrons, and ions. Different modes of imaging include absorption and emission, spectroscopy, and scattering that can be used in full field or scanning regimes. The approaches that collect information in the form of 2D images can also be extended to 3D characterisation by serial sectioning or reconstruction tomography. An important additional mode of near-surface property evaluation arises through the use of nanoscale contact tip sensors, such as AFM, nanoindentation, electrochemical probes, etc. Crucial underpinning for multi-beam microscopic characterization is provided by multi-scale materials modelling. The lecture will provide an overview of flavours of engineering microscopy and highlight the exciting opportunities presented by the combination of techniques in the form of so-called correlative microscopy. Examples of multi-modal correlative microscopy will include partially stabilized zirconia, biomaterials such as flax fibres and human dental tissues, and also advanced engineering alloys and ceramics″.

Original languageEnglish
Title of host publicationIMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015
EditorsDavid Dagan Feng, S. I. Ao, Craig Douglas, S. I. Ao, Craig Douglas, Jeong-A Lee, S. I. Ao, Oscar Castillo
PublisherNewswood Limited
Pages746-749
Number of pages4
Volume2
ISBN (Electronic)9789881925398
Publication statusPublished - 1 Jan 2015
EventInternational MultiConference of Engineers and Computer Scientists 2015, IMECS 2015 - Tsimshatsui, Kowloon, Hong Kong
Duration: 18 Mar 201520 Mar 2015

Conference

ConferenceInternational MultiConference of Engineers and Computer Scientists 2015, IMECS 2015
CountryHong Kong
CityTsimshatsui, Kowloon
Period18/03/1520/03/15

Keywords

  • FIB-SEM microscopy
  • Raman spectroscopy
  • SiC fibre

ASJC Scopus subject areas

  • Computer Science (miscellaneous)

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