Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

P. Dowd, L. Raddatz, Y. Sumaila, M. Asghari, I. H. White, R. V. Penty, P. J. Heard, G. C. Allen, R. P. Schneider, M. R.T. Tan, S. Y. Wang

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