Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

P. Dowd; L. Raddatz; Y. Sumaila; M. Asghari; I. H. White; R. V. Penty; P. J. Heard; G. C. Allen; R. P. Schneider; M. R.T. Tan; S. Y. Wang

doi:10.1109/68.618474

Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

P. Dowd, L. Raddatz, Y. Sumaila, M. Asghari, I. H. White, R. V. Penty, P. J. Heard, G. C. Allen, R. P. Schneider, M. R.T. Tan, S. Y. Wang

Vice Chancellor's Office

Research output: Contribution to journal › Article › peer-review

26 Citations (SciVal)

Abstract

Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

Original language	English
Pages (from-to)	1193-1195
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	9
Issue number	9
DOIs	https://doi.org/10.1109/68.618474
Publication status	Published - 1 Sept 1997

Keywords

Focused ion-beam etching
Reflectivity engineering
Transverse mode control
Vertical-cavity surface-emitting lasers

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1109/68.618474

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title = "Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching",

abstract = "Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.",

keywords = "Focused ion-beam etching, Reflectivity engineering, Transverse mode control, Vertical-cavity surface-emitting lasers",

author = "P. Dowd and L. Raddatz and Y. Sumaila and M. Asghari and White, {I. H.} and Penty, {R. V.} and Heard, {P. J.} and Allen, {G. C.} and Schneider, {R. P.} and Tan, {M. R.T.} and Wang, {S. Y.}",

year = "1997",

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doi = "10.1109/68.618474",

language = "English",

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journal = "IEEE Photonics Technology Letters",

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T1 - Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

AU - Dowd, P.

AU - Raddatz, L.

AU - Sumaila, Y.

AU - Asghari, M.

AU - White, I. H.

AU - Penty, R. V.

AU - Heard, P. J.

AU - Allen, G. C.

AU - Schneider, R. P.

AU - Tan, M. R.T.

AU - Wang, S. Y.

PY - 1997/9/1

Y1 - 1997/9/1

N2 - Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

AB - Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

KW - Focused ion-beam etching

KW - Reflectivity engineering

KW - Transverse mode control

KW - Vertical-cavity surface-emitting lasers

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DO - 10.1109/68.618474

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EP - 1195

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 9

ER -

Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

Abstract

Keywords

ASJC Scopus subject areas

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