Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

P. Dowd, L. Raddatz, Y. Sumaila, M. Asghari, I. H. White, R. V. Penty, P. J. Heard, G. C. Allen, R. P. Schneider, M. R.T. Tan, S. Y. Wang

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

Original languageEnglish
Pages (from-to)1193-1195
Number of pages3
JournalIEEE Photonics Technology Letters
Volume9
Issue number9
DOIs
Publication statusPublished - 1 Sep 1997

Keywords

  • Focused ion-beam etching
  • Reflectivity engineering
  • Transverse mode control
  • Vertical-cavity surface-emitting lasers

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Dowd, P., Raddatz, L., Sumaila, Y., Asghari, M., White, I. H., Penty, R. V., Heard, P. J., Allen, G. C., Schneider, R. P., Tan, M. R. T., & Wang, S. Y. (1997). Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching. IEEE Photonics Technology Letters, 9(9), 1193-1195. https://doi.org/10.1109/68.618474