Abstract
Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.
| Original language | English |
|---|---|
| Pages (from-to) | 1193-1195 |
| Number of pages | 3 |
| Journal | IEEE Photonics Technology Letters |
| Volume | 9 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1 Sept 1997 |
Funding
Manuscript received April 4, 1997; revised May 19, 1997. This work was supported in part by the EPSRC. The work of Y. Sumaila was supported by the Commonwealth Scholarship Association of Commonwealth Universities. P. Dowd, L. Raddatz, Y. Sumaila, M. Asghari, I. H. White, and R. V. Penty are with the Department of Electrical and Electronic Engineering, Queen’s Building, University of Bristol, University Walk, Bristol BS8 1TR, U.K. P. J. Heard and G. C. Allen are with Interface Analysis Centre, Oldbury House, University of Bristol, Bristol BS2 8BS, U.K. R. P. Schneider, M. R. T. Tan, and S. Y. Wang are with Hewlett Packard Laboratories, Palo Alto, CA 94303 USA. Publisher Item Identifier S 1041-1135(97)06344-1.
Keywords
- Focused ion-beam etching
- Reflectivity engineering
- Transverse mode control
- Vertical-cavity surface-emitting lasers
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering