Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy

A J Brook, S J Bending, J Pinto, A Oral, D Ritchie, H Beere, A Springthorpe, M Henini

Research output: Contribution to journalArticle

23 Citations (Scopus)
Original languageEnglish
Pages (from-to)124-128
Number of pages5
JournalJournal of Micromechanics and Microengineering
Volume13
Issue number1
Publication statusPublished - 2003

Cite this

Brook, A. J., Bending, S. J., Pinto, J., Oral, A., Ritchie, D., Beere, H., ... Henini, M. (2003). Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy. Journal of Micromechanics and Microengineering, 13(1), 124-128.

Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy. / Brook, A J; Bending, S J; Pinto, J; Oral, A; Ritchie, D; Beere, H; Springthorpe, A; Henini, M.

In: Journal of Micromechanics and Microengineering, Vol. 13, No. 1, 2003, p. 124-128.

Research output: Contribution to journalArticle

Brook, AJ, Bending, SJ, Pinto, J, Oral, A, Ritchie, D, Beere, H, Springthorpe, A & Henini, M 2003, 'Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy', Journal of Micromechanics and Microengineering, vol. 13, no. 1, pp. 124-128.
Brook, A J ; Bending, S J ; Pinto, J ; Oral, A ; Ritchie, D ; Beere, H ; Springthorpe, A ; Henini, M. / Micromachined III-V cantilevers for AFM-tracking scanning hall probe microscopy. In: Journal of Micromechanics and Microengineering. 2003 ; Vol. 13, No. 1. pp. 124-128.
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