Measuring the reactivity of a silicon-terminated probe

Adam Sweetman, Julian Stirling, Samuel Paul Jarvis, Philipp Rahe, Philip Moriarty

Research output: Contribution to journalArticle

Abstract

It is generally accepted that the exposed surfaces of silicon crystals are highly reactive due to the dangling bonds which protrude into the vacuum. However, surface reconstruction not only modifies the reactivity of bulk silicon crystals, but also plays a key role in determining the properties of silicon nanocrystals. In this study we probe the reactivity of silicon clusters at the end of a scanning probe tip by examining their interaction with closed-shell fullerene molecules. Counter to intuitive expectations, many silicon clusters do not react strongly with the fullerene cage, and we find that only specific highly oriented clusters have sufficient reactivity to break open the existing carbon-carbon bonds.
Original languageEnglish
Article number115440
Number of pages1
JournalPhysical Review B
Volume94
Issue number11
DOIs
Publication statusPublished - 30 Sep 2016

Cite this

Measuring the reactivity of a silicon-terminated probe. / Sweetman, Adam; Stirling, Julian; Jarvis, Samuel Paul; Rahe, Philipp; Moriarty, Philip.

In: Physical Review B, Vol. 94, No. 11, 115440, 30.09.2016.

Research output: Contribution to journalArticle

Sweetman, A, Stirling, J, Jarvis, SP, Rahe, P & Moriarty, P 2016, 'Measuring the reactivity of a silicon-terminated probe', Physical Review B, vol. 94, no. 11, 115440. https://doi.org/10.1103/PhysRevB.94.115440
Sweetman, Adam ; Stirling, Julian ; Jarvis, Samuel Paul ; Rahe, Philipp ; Moriarty, Philip. / Measuring the reactivity of a silicon-terminated probe. In: Physical Review B. 2016 ; Vol. 94, No. 11.
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