Measurement of features by a sample-grid approach

A J Medland, Glen Mullineux, A H Rentoul

Research output: Contribution to conference › Paper

Original languageEnglish
Pages673-677
Number of pages5
Publication statusPublished - 1994
EventAdvances in Manufacturing Technology VIII -
Duration: 1 Jan 1994 → …

Conference

ConferenceAdvances in Manufacturing Technology VIII
Period1/01/94 → …

Cite this

Medland, A. J., Mullineux, G., & Rentoul, A. H. (1994). Measurement of features by a sample-grid approach. 673-677. Paper presented at Advances in Manufacturing Technology VIII, .

Measurement of features by a sample-grid approach. / Medland, A J; Mullineux, Glen; Rentoul, A H.

1994. 673-677 Paper presented at Advances in Manufacturing Technology VIII, .

Research output: Contribution to conference › Paper

Medland, AJ, Mullineux, G & Rentoul, AH 1994, 'Measurement of features by a sample-grid approach', Paper presented at Advances in Manufacturing Technology VIII, 1/01/94 pp. 673-677.
Medland AJ, Mullineux G, Rentoul AH. Measurement of features by a sample-grid approach. 1994. Paper presented at Advances in Manufacturing Technology VIII, .
Medland, A J ; Mullineux, Glen ; Rentoul, A H. / Measurement of features by a sample-grid approach. Paper presented at Advances in Manufacturing Technology VIII, .5 p.
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note = "Advances in Manufacturing Technology VIII ; Conference date: 01-01-1994",

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