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Measurement of differential gain and linewidth enhancement factor of InGaAs vertical cavity surface emitting laser

  • P. Dowd
  • , H. D. Summers
  • , I. H. White
  • , M. R.T. Tan
  • , Y. M. Houng
  • , S. Y. Wang
  • University of Bath
  • Hewlett Packard Laboratories, Bristol

Research output: Contribution to journal › Article › peer-review

Abstract

The differential gain of an InGaAs/GaAs vertical cavity surface emitting laser (VCSEL) has been obtained through measurement of the subthreshold spectral linewidth. The results are in close agreement with a theoretical model for a VCSEL operating at the peak of the gain spectrum. The linewidth enhancement factor has been measured to be ~0.7at low bias currents again in agreement with theory.

Original languageEnglish
Pages (from-to)557-559
Number of pages3
JournalElectronics Letters
Volume31
Issue number7
DOIs
Publication statusPublished - 30 Mar 1995

Keywords

  • Laser linewidth
  • Vertical cavity surface emitting lasers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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