Measurement of differential gain and linewidth enhancement factor of InGaAs vertical cavity surface emitting laser

P. Dowd, H. D. Summers, I. H. White, M. R.T. Tan, Y. M. Houng, S. Y. Wang

Research output: Contribution to journalArticle

Abstract

The differential gain of an InGaAs/GaAs vertical cavity surface emitting laser (VCSEL) has been obtained through measurement of the subthreshold spectral linewidth. The results are in close agreement with a theoretical model for a VCSEL operating at the peak of the gain spectrum. The linewidth enhancement factor has been measured to be ~0.7at low bias currents again in agreement with theory.

Original languageEnglish
Pages (from-to)557-559
Number of pages3
JournalElectronics Letters
Volume31
Issue number7
DOIs
Publication statusPublished - 30 Mar 1995

Keywords

  • Laser linewidth
  • Vertical cavity surface emitting lasers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Measurement of differential gain and linewidth enhancement factor of InGaAs vertical cavity surface emitting laser. / Dowd, P.; Summers, H. D.; White, I. H.; Tan, M. R.T.; Houng, Y. M.; Wang, S. Y.

In: Electronics Letters, Vol. 31, No. 7, 30.03.1995, p. 557-559.

Research output: Contribution to journalArticle

Dowd, P. ; Summers, H. D. ; White, I. H. ; Tan, M. R.T. ; Houng, Y. M. ; Wang, S. Y. / Measurement of differential gain and linewidth enhancement factor of InGaAs vertical cavity surface emitting laser. In: Electronics Letters. 1995 ; Vol. 31, No. 7. pp. 557-559.
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