Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection

Bin Cai, W Dai, Jody E Muelaner, Paul G Maropoulos

Research output: Contribution to conferencePaper

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Abstract

Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.
Original languageEnglish
Pages438-442
Number of pages5
Publication statusPublished - 2010
EventThe 7th International Conference on Manufacturing Research (ICMR09) - University of Warwick, UK United Kingdom
Duration: 8 Sep 200910 Sep 2009

Conference

ConferenceThe 7th International Conference on Manufacturing Research (ICMR09)
CountryUK United Kingdom
CityUniversity of Warwick
Period8/09/0910/09/09

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