Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection

Bin Cai; W Dai; Jody E Muelaner; Paul G Maropoulos

Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection

Bin Cai, W Dai, Jody E Muelaner, Paul G Maropoulos

Department of Mechanical Engineering

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Abstract

Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

Original language	English
Pages	438-442
Number of pages	5
Publication status	Published - 2010
Event	The 7th International Conference on Manufacturing Research (ICMR09) - University of Warwick, UK United Kingdom Duration: 8 Sept 2009 → 10 Sept 2009

Conference

Conference	The 7th International Conference on Manufacturing Research (ICMR09)
Country/Territory	UK United Kingdom
City	University of Warwick
Period	8/09/09 → 10/09/09

Bibliographical note

Published in 2010 in Proceedings of the Advances in Manufacturing Technology - XXIII

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Muelaner_ICMR_2009_438.pdfAccepted author manuscript, 4.26 MB

Cite this

@conference{7a887b6d983a461f9e504c822008dfaa,

title = "Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection",

abstract = "Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.",

author = "Bin Cai and W Dai and Muelaner, {Jody E} and Maropoulos, {Paul G}",

note = "Published in 2010 in Proceedings of the Advances in Manufacturing Technology - XXIII; The 7th International Conference on Manufacturing Research (ICMR09) ; Conference date: 08-09-2009 Through 10-09-2009",

year = "2010",

language = "English",

pages = "438--442",

}

TY - CONF

T1 - Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection

AU - Cai, Bin

AU - Dai, W

AU - Muelaner, Jody E

AU - Maropoulos, Paul G

N1 - Published in 2010 in Proceedings of the Advances in Manufacturing Technology - XXIII

PY - 2010

Y1 - 2010

N2 - Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

AB - Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

M3 - Paper

SP - 438

EP - 442

T2 - The 7th International Conference on Manufacturing Research (ICMR09)

Y2 - 8 September 2009 through 10 September 2009

ER -

Measurability Characteristics Mapping for Large Volume Metrology Instruments Selection

Abstract

Conference

Bibliographical note

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Cite this