Mapping the plasmon response of Ag nanoislands on graphite at 100 nm resolution with scanning probe energy loss spectroscopy

Shane Murphy, Karl Bauer, Peter Sloan, James Lawton, Lin Tang, R Palmer

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We demonstrate plasmon mapping of Ag nanostructures on graphite using scanning probe energy loss spectroscopy (SPELS) with a spatial resolution of 100 nm. In SPELS, an STM tip is used as a localized source of field-emitted electrons to probe the sample surface. The energy loss spectrum of the backscattered electrons is measured to provide a chemical signature of the surface under the tip. We acquire three images simultaneously with SPELS: i) constant-current field-emission images, which provide topographical information; ii) backscattered electron images, which display material contrast; and iii) SPELS images, where material-dependent features such as plasmons are mapped.
Original languageEnglish
Article number126601
JournalApplied Physics Express
Volume8
DOIs
Publication statusPublished - 13 Nov 2015

Fingerprint

Energy dissipation
Graphite
graphite
energy dissipation
Spectroscopy
Scanning
scanning
probes
spectroscopy
Electrons
Plasmons
electrons
plasmons
Field emission
field emission
Nanostructures
spatial resolution
signatures

Cite this

Mapping the plasmon response of Ag nanoislands on graphite at 100 nm resolution with scanning probe energy loss spectroscopy. / Murphy, Shane; Bauer, Karl; Sloan, Peter; Lawton, James; Tang, Lin; Palmer, R.

In: Applied Physics Express, Vol. 8, 126601, 13.11.2015.

Research output: Contribution to journalArticle

@article{a84217dc03c44e0b88706ba37b550b84,
title = "Mapping the plasmon response of Ag nanoislands on graphite at 100 nm resolution with scanning probe energy loss spectroscopy",
abstract = "We demonstrate plasmon mapping of Ag nanostructures on graphite using scanning probe energy loss spectroscopy (SPELS) with a spatial resolution of 100 nm. In SPELS, an STM tip is used as a localized source of field-emitted electrons to probe the sample surface. The energy loss spectrum of the backscattered electrons is measured to provide a chemical signature of the surface under the tip. We acquire three images simultaneously with SPELS: i) constant-current field-emission images, which provide topographical information; ii) backscattered electron images, which display material contrast; and iii) SPELS images, where material-dependent features such as plasmons are mapped.",
author = "Shane Murphy and Karl Bauer and Peter Sloan and James Lawton and Lin Tang and R Palmer",
year = "2015",
month = "11",
day = "13",
doi = "10.7567/APEX.8.126601",
language = "English",
volume = "8",
journal = "Applied Physics Express",
issn = "1882-0786",
publisher = "Japan Society of Applied Physics",

}

TY - JOUR

T1 - Mapping the plasmon response of Ag nanoislands on graphite at 100 nm resolution with scanning probe energy loss spectroscopy

AU - Murphy, Shane

AU - Bauer, Karl

AU - Sloan, Peter

AU - Lawton, James

AU - Tang, Lin

AU - Palmer, R

PY - 2015/11/13

Y1 - 2015/11/13

N2 - We demonstrate plasmon mapping of Ag nanostructures on graphite using scanning probe energy loss spectroscopy (SPELS) with a spatial resolution of 100 nm. In SPELS, an STM tip is used as a localized source of field-emitted electrons to probe the sample surface. The energy loss spectrum of the backscattered electrons is measured to provide a chemical signature of the surface under the tip. We acquire three images simultaneously with SPELS: i) constant-current field-emission images, which provide topographical information; ii) backscattered electron images, which display material contrast; and iii) SPELS images, where material-dependent features such as plasmons are mapped.

AB - We demonstrate plasmon mapping of Ag nanostructures on graphite using scanning probe energy loss spectroscopy (SPELS) with a spatial resolution of 100 nm. In SPELS, an STM tip is used as a localized source of field-emitted electrons to probe the sample surface. The energy loss spectrum of the backscattered electrons is measured to provide a chemical signature of the surface under the tip. We acquire three images simultaneously with SPELS: i) constant-current field-emission images, which provide topographical information; ii) backscattered electron images, which display material contrast; and iii) SPELS images, where material-dependent features such as plasmons are mapped.

U2 - 10.7567/APEX.8.126601

DO - 10.7567/APEX.8.126601

M3 - Article

VL - 8

JO - Applied Physics Express

JF - Applied Physics Express

SN - 1882-0786

M1 - 126601

ER -