Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez; I Ederra; R Gonzalo; B Alderman; L Azcona; P G Huggard; B de Hon; A Hussain; S R Andrews; L Marchand; P de Maagt

doi:10.1109/TMTT.2007.892803

Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez
, I Ederra
, R Gonzalo
, B Alderman
, L Azcona
, P G Huggard
, B de Hon
, A Hussain
, S R Andrews
, L Marchand
, P de Maagt

Department of Physics

Research output: Contribution to journal › Article › peer-review

26 Citations (SciVal)

Original language	English
Pages (from-to)	672-681
Number of pages	10
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	55
Issue number	4
DOIs	https://doi.org/10.1109/TMTT.2007.892803
Publication status	Published - 2007

Bibliographical note

ID number: ISI:000245768700010

Access to Document

10.1109/TMTT.2007.892803

Cite this

Martinez, B., Ederra, I., Gonzalo, R., Alderman, B., Azcona, L., Huggard, P. G., de Hon, B., Hussain, A., Andrews, S. R., Marchand, L., & de Maagt, P. (2007). Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals. IEEE Transactions on Microwave Theory and Techniques, 55(4), 672-681. https://doi.org/10.1109/TMTT.2007.892803

Martinez, B, Ederra, I, Gonzalo, R, Alderman, B, Azcona, L, Huggard, PG, de Hon, B, Hussain, A, Andrews, SR, Marchand, L & de Maagt, P 2007, 'Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals', IEEE Transactions on Microwave Theory and Techniques, vol. 55, no. 4, pp. 672-681. https://doi.org/10.1109/TMTT.2007.892803

@article{87645f68e8fc4e889b2113dc9a328c71,

title = "Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals",

author = "B Martinez and I Ederra and R Gonzalo and B Alderman and L Azcona and Huggard, \{P G\} and \{de Hon\}, B and A Hussain and Andrews, \{S R\} and L Marchand and \{de Maagt\}, P",

note = "ID number: ISI:000245768700010",

year = "2007",

doi = "10.1109/TMTT.2007.892803",

language = "English",

volume = "55",

pages = "672--681",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "IEEE",

number = "4",

}

TY - JOUR

T1 - Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

AU - Martinez, B

AU - Ederra, I

AU - Gonzalo, R

AU - Alderman, B

AU - Azcona, L

AU - Huggard, P G

AU - de Hon, B

AU - Hussain, A

AU - Andrews, S R

AU - Marchand, L

AU - de Maagt, P

N1 - ID number: ISI:000245768700010

PY - 2007

Y1 - 2007

U2 - 10.1109/TMTT.2007.892803

DO - 10.1109/TMTT.2007.892803

M3 - Article

SN - 0018-9480

VL - 55

SP - 672

EP - 681

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 4

ER -