Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez, I Ederra, R Gonzalo, B Alderman, L Azcona, P G Huggard, B de Hon, A Hussain, S R Andrews, L Marchand, P de Maagt

Research output: Contribution to journalArticlepeer-review

26 Citations (SciVal)
Original languageEnglish
Pages (from-to)672-681
Number of pages10
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number4
Publication statusPublished - 2007

Bibliographical note

ID number: ISI:000245768700010

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