Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez, I Ederra, R Gonzalo, B Alderman, L Azcona, P G Huggard, B de Hon, A Hussain, S R Andrews, L Marchand, P de Maagt

Research output: Contribution to journalArticle

26 Citations (Scopus)
Original languageEnglish
Pages (from-to)672-681
Number of pages10
JournalIEEE Transactions on Microwave Theory and Techniques
Volume55
Issue number4
Publication statusPublished - 2007

Cite this

Martinez, B., Ederra, I., Gonzalo, R., Alderman, B., Azcona, L., Huggard, P. G., de Hon, B., Hussain, A., Andrews, S. R., Marchand, L., & de Maagt, P. (2007). Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals. IEEE Transactions on Microwave Theory and Techniques, 55(4), 672-681.