Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez; I Ederra; R Gonzalo; B Alderman; L Azcona; P G Huggard; B de Hon; A Hussain; S R Andrews; L Marchand; P de Maagt

Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez, I Ederra, R Gonzalo, B Alderman, L Azcona, P G Huggard, B de Hon, A Hussain, S R Andrews, L Marchand, P de Maagt

Department of Physics

Research output: Contribution to journal › Article › peer-review

26 Citations (SciVal)

Original language	English
Pages (from-to)	672-681
Number of pages	10
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	55
Issue number	4
Publication status	Published - 2007

Bibliographical note

ID number: ISI:000245768700010

Cite this

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title = "Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals",

author = "B Martinez and I Ederra and R Gonzalo and B Alderman and L Azcona and Huggard, {P G} and {de Hon}, B and A Hussain and Andrews, {S R} and L Marchand and {de Maagt}, P",

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year = "2007",

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journal = "IEEE Transactions on Microwave Theory and Techniques",

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T1 - Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

AU - Martinez, B

AU - Ederra, I

AU - Gonzalo, R

AU - Alderman, B

AU - Azcona, L

AU - Huggard, P G

AU - de Hon, B

AU - Hussain, A

AU - Andrews, S R

AU - Marchand, L

AU - de Maagt, P

N1 - ID number: ISI:000245768700010

PY - 2007

Y1 - 2007

M3 - Article

SN - 0018-9480

VL - 55

SP - 672

EP - 681

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 4

ER -