Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals

B Martinez, I Ederra, R Gonzalo, B Alderman, L Azcona, P G Huggard, B de Hon, A Hussain, S R Andrews, L Marchand, P de Maagt

Research output: Contribution to journalArticle

26 Citations (Scopus)
Original languageEnglish
Pages (from-to)672-681
Number of pages10
JournalIEEE Transactions on Microwave Theory and Techniques
Volume55
Issue number4
Publication statusPublished - 2007

Cite this

Martinez, B., Ederra, I., Gonzalo, R., Alderman, B., Azcona, L., Huggard, P. G., ... de Maagt, P. (2007). Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals. IEEE Transactions on Microwave Theory and Techniques, 55(4), 672-681.

Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals. / Martinez, B; Ederra, I; Gonzalo, R; Alderman, B; Azcona, L; Huggard, P G; de Hon, B; Hussain, A; Andrews, S R; Marchand, L; de Maagt, P.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 55, No. 4, 2007, p. 672-681.

Research output: Contribution to journalArticle

Martinez, B, Ederra, I, Gonzalo, R, Alderman, B, Azcona, L, Huggard, PG, de Hon, B, Hussain, A, Andrews, SR, Marchand, L & de Maagt, P 2007, 'Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals', IEEE Transactions on Microwave Theory and Techniques, vol. 55, no. 4, pp. 672-681.
Martinez, B ; Ederra, I ; Gonzalo, R ; Alderman, B ; Azcona, L ; Huggard, P G ; de Hon, B ; Hussain, A ; Andrews, S R ; Marchand, L ; de Maagt, P. / Manufacturing tolerance analysis, fabrication, and characterization of 3-D submillimeter-wave electromagnetic-bandgap crystals. In: IEEE Transactions on Microwave Theory and Techniques. 2007 ; Vol. 55, No. 4. pp. 672-681.
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