Magnetic phases of sputter deposited thin-film erbium

J. D.S. Witt; J. F.K. Cooper; N. Satchell; C. J. Kinane; P. J. Curran; S. J. Bending; S. Langridge; L. J. Heyderman; G. Burnell

doi:10.1038/srep39021

Magnetic phases of sputter deposited thin-film erbium

J. D.S. Witt, J. F.K. Cooper, N. Satchell, C. J. Kinane, P. J. Curran, S. J. Bending, S. Langridge, L. J. Heyderman, G. Burnell

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Abstract

We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction. This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced. Also of interest is the identification of a conical magnetic state which repeats with a wavevector parallel to the c axis '., c = 4/17 in units of the reciprocal lattice parameter c ∗, which is a state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H, T)-phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system.

Original language	English
Article number	39021
Journal	Scientific Reports
Volume	6
DOIs	https://doi.org/10.1038/srep39021
Publication status	Published - 14 Dec 2016

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@article{5b75195eafdd46e39e42918ba0a2c4de,

title = "Magnetic phases of sputter deposited thin-film erbium",

abstract = "We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction. This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced. Also of interest is the identification of a conical magnetic state which repeats with a wavevector parallel to the c axis '., c = 4/17 in units of the reciprocal lattice parameter c ∗, which is a state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H, T)-phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system.",

author = "Witt, {J. D.S.} and Cooper, {J. F.K.} and N. Satchell and Kinane, {C. J.} and Curran, {P. J.} and Bending, {S. J.} and S. Langridge and Heyderman, {L. J.} and G. Burnell",

note = "Funding Information: The authors would like to thank the UK EPSRC (grant numbers: EP/J010634/1, EP/J010650/1, EP/J010626/1) for their financial support. Experiments at the ISIS Pulsed Neutron Source were supported by a beamtime allocation from the Science and Technology Facilities Council (RB 1410611) and we acknowledge the ISIS R532 characterisation laboratory for use of the X-ray equipment. NS acknowledges JEOL Europe and ISIS neutron and muon source for PhD funding. Publisher Copyright: {\textcopyright} The Author(s) 2016. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.",

year = "2016",

month = dec,

day = "14",

doi = "10.1038/srep39021",

language = "English",

volume = "6",

journal = "Scientific Reports",

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T1 - Magnetic phases of sputter deposited thin-film erbium

AU - Witt, J. D.S.

AU - Cooper, J. F.K.

AU - Satchell, N.

AU - Kinane, C. J.

AU - Curran, P. J.

AU - Bending, S. J.

AU - Langridge, S.

AU - Heyderman, L. J.

AU - Burnell, G.

N1 - Funding Information: The authors would like to thank the UK EPSRC (grant numbers: EP/J010634/1, EP/J010650/1, EP/J010626/1) for their financial support. Experiments at the ISIS Pulsed Neutron Source were supported by a beamtime allocation from the Science and Technology Facilities Council (RB 1410611) and we acknowledge the ISIS R532 characterisation laboratory for use of the X-ray equipment. NS acknowledges JEOL Europe and ISIS neutron and muon source for PhD funding. Publisher Copyright: © The Author(s) 2016. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.

PY - 2016/12/14

Y1 - 2016/12/14

N2 - We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction. This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced. Also of interest is the identification of a conical magnetic state which repeats with a wavevector parallel to the c axis '., c = 4/17 in units of the reciprocal lattice parameter c ∗, which is a state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H, T)-phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system.

AB - We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction. This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced. Also of interest is the identification of a conical magnetic state which repeats with a wavevector parallel to the c axis '., c = 4/17 in units of the reciprocal lattice parameter c ∗, which is a state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H, T)-phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system.

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