Low-frequency noise as a diagnostic tool for OLED reliability

P. R F Rocha, L. K J Vandamme, S. C J Meskers, H. L. Gomes, D. M. De Leeuw, P. Van De Weijer

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

10 Citations (SciVal)

Fingerprint

Dive into the research topics of 'Low-frequency noise as a diagnostic tool for OLED reliability'. Together they form a unique fingerprint.

Physics & Astronomy