Long pulse excitation thermographic non-destructive evaluation

Darryl P. Almond, Stefano L. Angioni, Simon G. Pickering

Research output: Contribution to journalArticle

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Abstract

A comprehensive analysis of the defect detection performance of long pulse excitation thermographic NDE is presented. An analytical procedure for predicting the thermal image contrasts of defects of specified size and depth is developed and validated by extensive experimental studies of test pieces having a wide range of thermal properties. Results obtained using long pulse (~5 s) excitation are compared with those obtained using traditional flash excitation. The conditions necessary for the success of the long pulse method are explained and illustrated by both modelling and experimental results. Practical advantages of long pulse excitation are discussed.
LanguageEnglish
Pages7-14
JournalNDT and E International
Volume87
Early online date4 Jan 2017
DOIs
StatusPublished - 1 Apr 2017

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Thermodynamic properties
Defects
evaluation
pulses
excitation
defects
image contrast
flash
thermodynamic properties
Defect detection
Hot Temperature

Cite this

Long pulse excitation thermographic non-destructive evaluation. / Almond, Darryl P.; Angioni, Stefano L.; Pickering, Simon G.

In: NDT and E International, Vol. 87, 01.04.2017, p. 7-14.

Research output: Contribution to journalArticle

Almond, Darryl P. ; Angioni, Stefano L. ; Pickering, Simon G. / Long pulse excitation thermographic non-destructive evaluation. In: NDT and E International. 2017 ; Vol. 87. pp. 7-14.
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