Learning Local Metrics and Influential Regions for Classification

Mingzhi Dong, Yujiang Wang, Xiaochen Yang, Jing Hao Xue

Research output: Contribution to journalArticlepeer-review

18 Citations (SciVal)

Abstract

The performance of distance-based classifiers heavily depends on the underlying distance metric, so it is valuable to learn a suitable metric from the data. To address the problem of multimodality, it is desirable to learn local metrics. In this short paper, we define a new intuitive distance with local metrics and influential regions, and subsequently propose a novel local metric learning algorithm called LMLIR for distance-based classification. Our key intuition is to partition the metric space into influential regions and a background region, and then regulate the effectiveness of each local metric to be within the related influential regions. We learn multiple local metrics and influential regions to reduce the empirical hinge loss, and regularize the parameters on the basis of a resultant learning bound. Encouraging experimental results are obtained from various public and popular data sets.

Original languageEnglish
Article number8705322
Pages (from-to)1522-1529
Number of pages8
JournalIEEE Transactions on Pattern Analysis and Machine Intelligence
Volume42
Issue number6
DOIs
Publication statusPublished - 1 Jun 2020

Bibliographical note

Publisher Copyright:
© 1979-2012 IEEE.

Keywords

  • distance metric
  • Distance-based classification
  • local metric
  • metric learning

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition
  • Computational Theory and Mathematics
  • Artificial Intelligence
  • Applied Mathematics

Fingerprint

Dive into the research topics of 'Learning Local Metrics and Influential Regions for Classification'. Together they form a unique fingerprint.

Cite this