Leakage current studies of thick a-Si:H detectors under high electric field conditions

Adelina Ilie, B Equer, T Pochet

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The leakage current of thick (up to 20 μm) a-Si:H p-i-n diodes developed for nuclear radiation detection were investigated. Performing current-voltage measurements at different temperatures and over a large electric field domain (up to 106 V/cm), different leakage current mechanisms, such as electron injection and field enhanced thermal generation, have been identified. The influence of the p layer thickness on the electronic injection was clearly demonstrated by means of spectral response experiments. The effect of a device forming procedure on the leakage current and on the noise power spectra of the devices has also been studied.
Original languageEnglish
Pages (from-to)18 - 22
Number of pages5
JournalNuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
Volume380
Issue number1-2
DOIs
Publication statusPublished - 1 Oct 1996

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