Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model

Chun Hung Cheng, Dehong H Huo, Xi Zhang, Wei Dai, Paul G Maropoulos

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

Aircraft manufacturing industries are looking for solutions in order to increase their productivity. One of the solutions is to apply the metrology systems during the production and assembly processes. Metrology Process Model (MPM) (Maropoulos et al, 2007) has been introduced which emphasises metrology applications with assembly planning, manufacturing processes and product designing. Measurability analysis is part of the MPM and the aim of this analysis is to check the feasibility for measuring the designed large scale components. Measurability Analysis has been integrated in order to provide an efficient matching system. Metrology database is structured by developing the Metrology Classification Model. Furthermore, the feature-based selection model is also explained. By combining two classification models, a novel approach and selection processes for integrated measurability analysis system (MAS) are introduced and such integrated MAS could provide much more meaningful matching results for the operators.
Original languageEnglish
Title of host publicationProceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
EditorsG Q Huang, K L Mak, P G Maropoulos
Place of PublicationBerlin, Heidelberg
PublisherSpringer
Pages1013-1026
Number of pages14
Volume66
ISBN (Electronic)978-3-642-10430-5
ISBN (Print)9783642104299
DOIs
Publication statusPublished - 2010
Event6th International Conference on Digital Enterprise Technology (DET 2009) - Hong Kong, Hong Kong
Duration: 14 Dec 200916 Dec 2009

Publication series

NameAdvances in Intelligent and Soft Computing
PublisherSpringer Verlag

Conference

Conference6th International Conference on Digital Enterprise Technology (DET 2009)
Abbreviated titleDET2009
CountryHong Kong
CityHong Kong
Period14/12/0916/12/09

Keywords

  • measurability analysis
  • feature-based selection model
  • metrology classification model
  • process modelling
  • assembly planning

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