TY - JOUR
T1 - Landau levels in deformed bilayer graphene at low magnetic fields
AU - Mucha-Kruczynski, Marcin
AU - Aleiner, I.L.
AU - Fal'Ko, V.I.
PY - 2011/8/1
Y1 - 2011/8/1
N2 - We review the effect of uniaxial strain on the low-energy electronic dispersion and Landau level structure of bilayer graphene. Based on the tight-binding approach, we derive a strain-induced term in the low-energy Hamiltonian and show how strain affects the low-energy electronic band structure. Depending on the magnitude and direction of applied strain, we identify three regimes of qualitatively different electronic dispersions. We also show that in a weak magnetic field, sufficient strain results in the filling factor ν=±4 being the most stable in the quantum Hall effect measurement, instead of ν=±8 in unperturbed bilayer at a weak magnetic field. To mention, in one of the strain regimes, the activation gap at ν=±4 is, down to very low fields, weakly dependent on the strength of the magnetic field.
AB - We review the effect of uniaxial strain on the low-energy electronic dispersion and Landau level structure of bilayer graphene. Based on the tight-binding approach, we derive a strain-induced term in the low-energy Hamiltonian and show how strain affects the low-energy electronic band structure. Depending on the magnitude and direction of applied strain, we identify three regimes of qualitatively different electronic dispersions. We also show that in a weak magnetic field, sufficient strain results in the filling factor ν=±4 being the most stable in the quantum Hall effect measurement, instead of ν=±8 in unperturbed bilayer at a weak magnetic field. To mention, in one of the strain regimes, the activation gap at ν=±4 is, down to very low fields, weakly dependent on the strength of the magnetic field.
UR - http://www.scopus.com/inward/record.url?scp=79960068016&partnerID=8YFLogxK
UR - http://dx.doi.org/10.1016/j.ssc.2011.05.019
U2 - 10.1016/j.ssc.2011.05.019
DO - 10.1016/j.ssc.2011.05.019
M3 - Article
AN - SCOPUS:79960068016
SN - 0038-1098
VL - 151
SP - 1088
EP - 1093
JO - Solid State Communications
JF - Solid State Communications
IS - 16
ER -