Laboratory assessment of WLAN performance degradation in the presence of impulsive noise

Qingshan Shan, I. A. Glover, P. J. Moore, I. E. Portugues, R. J. Watson, R. Rutherford, R. Atkinson, Shahzad Bhatti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

a laboratory test to assess the impact of impulsive noise on the performance of WLAN equipment is described. The test is put in the context of a larger programme of work to assess the performance ands reliability of wireless equipment subject to partial discharge noise in high voltage electricity supply substations. The character of partial discharge and WLAN technology are briefly reviewed. The laboratory test methodology is reported and some preliminary results are presented. A related forthcoming field-trial for tests of WLAN equipment in a 275/400 kV air-insulated substation is briefly described.

Original languageEnglish
Title of host publicationInternational Wireless Communications and Mobile Computing Conference (IWCMC), 2008
Place of PublicationU. S. A.
PublisherIEEE
Pages859-863
Number of pages5
ISBN (Print)9781424422012
DOIs
Publication statusPublished - 6 Oct 2008
EventInternational Wireless Communications and Mobile Computing Conference, IWCMC 2008 - Crete, Greece
Duration: 6 Aug 20088 Aug 2008

Conference

ConferenceInternational Wireless Communications and Mobile Computing Conference, IWCMC 2008
CountryGreece
CityCrete
Period6/08/088/08/08

Keywords

  • Electricity supply substation
  • IEEE 802.11 a/b/g
  • Partial discharge
  • WLAN
  • WPAN

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Software
  • Electrical and Electronic Engineering

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  • Cite this

    Shan, Q., Glover, I. A., Moore, P. J., Portugues, I. E., Watson, R. J., Rutherford, R., Atkinson, R., & Bhatti, S. (2008). Laboratory assessment of WLAN performance degradation in the presence of impulsive noise. In International Wireless Communications and Mobile Computing Conference (IWCMC), 2008 (pp. 859-863). [4600047] IEEE. https://doi.org/10.1109/IWCMC.2008.148