Label-Free Electrical Detection of DNA using Metal-Insulator-Semiconductor Structures

Pedro Estrela, P Migliorato, H Takiguchi, H Fukushima, S Nebashi

Research output: Contribution to conferencePaper

Original languageEnglish
Publication statusUnpublished - 2004
Event205th Meeting of The Electrochemical Society - San Antonio, Texas, USA United States
Duration: 9 May 200413 May 2004

Conference

Conference205th Meeting of The Electrochemical Society
CountryUSA United States
CitySan Antonio, Texas
Period9/05/0413/05/04

Cite this

Estrela, P., Migliorato, P., Takiguchi, H., Fukushima, H., & Nebashi, S. (2004). Label-Free Electrical Detection of DNA using Metal-Insulator-Semiconductor Structures. Paper presented at 205th Meeting of The Electrochemical Society, San Antonio, Texas, USA United States.