Investigation of strain-relaxation characteristics of nitrides grown on Si(110) by metalorganic chemical vapor deposition using X-ray diffraction

Quanzhong Jiang, Christopher J. Lewins, Duncan W. E. Allsopp, Chris R. Bowen, Wang N. Wang

Research output: Contribution to journal › Article › peer-review

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- Title(descending)

MC2- X-ray diffraction (XRD)
Material and Chemical Characterisation (MC2)
Facility/equipment: Technology type