Intersubband scattering in double-gate MOSFETs

Kei Takashina, Yukinori Ono, Akira Fujiwara, Yasuo Takahashi, Yoshiro Hirayama

Research output: Contribution to journalArticlepeer-review

4 Citations (SciVal)
Original languageEnglish
Pages (from-to)430-435
JournalIEEE Transactions on Nanotechnology
Volume5
Issue number5
DOIs
Publication statusPublished - 11 Sep 2006

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