Intersubband scattering in double-gate MOSFETs

Kei Takashina, Yukinori Ono, Akira Fujiwara, Yasuo Takahashi, Yoshiro Hirayama

Research output: Contribution to journalArticle

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)430-435
JournalIEEE Transactions on Nanotechnology
Volume5
Issue number5
DOIs
Publication statusPublished - 11 Sep 2006

Cite this

Intersubband scattering in double-gate MOSFETs. / Takashina, Kei; Ono, Yukinori; Fujiwara, Akira; Takahashi, Yasuo; Hirayama, Yoshiro.

In: IEEE Transactions on Nanotechnology, Vol. 5, No. 5, 11.09.2006, p. 430-435.

Research output: Contribution to journalArticle

Takashina, Kei ; Ono, Yukinori ; Fujiwara, Akira ; Takahashi, Yasuo ; Hirayama, Yoshiro. / Intersubband scattering in double-gate MOSFETs. In: IEEE Transactions on Nanotechnology. 2006 ; Vol. 5, No. 5. pp. 430-435.
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