Original language | English |
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Pages (from-to) | 3538-3540 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 82 |
Issue number | 20 |
Publication status | Published - 2003 |
Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy
A J Brook, S J Bending, J Pinto, A Oral, D Ritchie, H Beere, M Henini, A Springthorpe
Research output: Contribution to journal › Article › peer-review
29
Citations
(SciVal)