Abstract
Reconstruction of conductive inclusions in a homogeneous background medium is commonly seen in electrical impedance tomography (EIT). One of the methods to deal with the inclusion reconstruction problems is the shape-based method. With prior knowledge of conductivity of target inclusions, the boundary of inclusions is parameterized by several shape coefficients and recovered from EIT measurements. This paper presents a shape-based inclusion reconstruction method and its numerical implementation with boundary element method (BEM). A shape perturbation method (SPM) is proposed to calculate the shape sensitivity in EIT. To evaluate the accuracy of the presented method, a series of numerical tests are conducted. The characteristics of EIT shape sensitivity are analysed. Some factors influencing the reconstruction performance are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 1037-1061 |
| Number of pages | 25 |
| Journal | Inverse Problems in Science and Engineering |
| Volume | 26 |
| Issue number | 7 |
| Early online date | 8 Sept 2017 |
| DOIs | |
| Publication status | Published - 2018 |
Keywords
- Inverse problem
- boundary element method
- electrical impedance tomography
- inclusion reconstruction
- shape sensitivity
ASJC Scopus subject areas
- General Engineering
- Computer Science Applications
- Applied Mathematics
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Manuchehr Soleimani
- Department of Electronic & Electrical Engineering - Professor
- Electronics Materials, Circuits & Systems Research Unit (EMaCS)
- Bath Institute for the Augmented Human
- Centre for Bioengineering & Biomedical Technologies (CBio)
- The Foundry: Centre for Digital, Manufacturing & Design
Person: Research & Teaching, Core staff, Affiliate staff
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