Reconstruction of conductive inclusions in a homogeneous background medium is commonly seen in electrical impedance tomography (EIT). One of the methods to deal with the inclusion reconstruction problems is the shape-based method. With prior knowledge of conductivity of target inclusions, the boundary of inclusions is parameterized by several shape coefficients and recovered from EIT measurements. This paper presents a shape-based inclusion reconstruction method and its numerical implementation with boundary element method (BEM). A shape perturbation method (SPM) is proposed to calculate the shape sensitivity in EIT. To evaluate the accuracy of the presented method, a series of numerical tests are conducted. The characteristics of EIT shape sensitivity are analysed. Some factors influencing the reconstruction performance are discussed.
- Inverse problem
- boundary element method
- electrical impedance tomography
- inclusion reconstruction
- shape sensitivity
ASJC Scopus subject areas
- Computer Science Applications
- Applied Mathematics
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- Department of Electronic & Electrical Engineering - Professor
- EPSRC Centre for Doctoral Training in Statistical Applied Mathematics (SAMBa)
- Centre for Biosensors, Bioelectronics and Biodevices (C3Bio)
- Centre for Autonomous Robotics (CENTAUR)
- Electronics Materials, Circuits & Systems Research Unit (EMaCS)
Person: Research & Teaching