Inclusion boundary reconstruction and sensitivity analysis in Electrical Impedance Tomography

S Ren, Manuchehr Soleimani, Y Xu, F. Dong

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41 Citations (SciVal)
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Reconstruction of conductive inclusions in a homogeneous background medium is commonly seen in electrical impedance tomography (EIT). One of the methods to deal with the inclusion reconstruction problems is the shape-based method. With prior knowledge of conductivity of target inclusions, the boundary of inclusions is parameterized by several shape coefficients and recovered from EIT measurements. This paper presents a shape-based inclusion reconstruction method and its numerical implementation with boundary element method (BEM). A shape perturbation method (SPM) is proposed to calculate the shape sensitivity in EIT. To evaluate the accuracy of the presented method, a series of numerical tests are conducted. The characteristics of EIT shape sensitivity are analysed. Some factors influencing the reconstruction performance are discussed.

Original languageEnglish
Pages (from-to)1037-1061
Number of pages25
JournalInverse Problems in Science and Engineering
Issue number7
Early online date8 Sept 2017
Publication statusPublished - 2018


  • Inverse problem
  • boundary element method
  • electrical impedance tomography
  • inclusion reconstruction
  • shape sensitivity

ASJC Scopus subject areas

  • General Engineering
  • Computer Science Applications
  • Applied Mathematics


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