Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits

S. Ali; Ke Li; R. Wilcock; P. Wilson

doi:10.1109/DATE.2009.5090757

Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits

S. Ali, Ke Li, R. Wilcock, P. Wilson

Department of Electronic & Electrical Engineering

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

4 Citations (SciVal)

Original language	English
Title of host publication	Design, Automation & Test in Europe Conference & Exhibition (DATE), 2009
Publisher	IEEE
Pages	712-717
ISBN (Print)	9781424437818
DOIs	https://doi.org/10.1109/DATE.2009.5090757
Publication status	Published - 1 Apr 2009
Event	Design, Automation & Test in Europe Conference & Exhibition, 2009 - Nice, France Duration: 20 Apr 2009 → 24 Apr 2009

Conference

Conference	Design, Automation & Test in Europe Conference & Exhibition, 2009
Country/Territory	France
City	Nice
Period	20/04/09 → 24/04/09

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10.1109/DATE.2009.5090757

Cite this

Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits. / Ali, S.; Li, Ke; Wilcock, R. et al.
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2009. IEEE, 2009. p. 712-717.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Ali, S, Li, K, Wilcock, R & Wilson, P 2009, Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits. in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2009. IEEE, pp. 712-717, Design, Automation & Test in Europe Conference & Exhibition, 2009, Nice, France, 20/04/09. https://doi.org/10.1109/DATE.2009.5090757

@inproceedings{15455ea317df4c36aca7305dcbbfc26b,

title = "Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits",

author = "S. Ali and Ke Li and R. Wilcock and P. Wilson",

year = "2009",

month = apr,

day = "1",

doi = "10.1109/DATE.2009.5090757",

language = "English",

isbn = "9781424437818 ",

pages = "712--717",

booktitle = "Design, Automation & Test in Europe Conference & Exhibition (DATE), 2009",

publisher = "IEEE",

address = "USA United States",

note = "Design, Automation & Test in Europe Conference & Exhibition, 2009 ; Conference date: 20-04-2009 Through 24-04-2009",

}

TY - GEN

T1 - Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits

AU - Ali, S.

AU - Li, Ke

AU - Wilcock, R.

AU - Wilson, P.

PY - 2009/4/1

Y1 - 2009/4/1

UR - http://dx.doi.org/10.1109/DATE.2009.5090757

U2 - 10.1109/DATE.2009.5090757

DO - 10.1109/DATE.2009.5090757

M3 - Chapter in a published conference proceeding

SN - 9781424437818

SP - 712

EP - 717

BT - Design, Automation & Test in Europe Conference & Exhibition (DATE), 2009

PB - IEEE

T2 - Design, Automation & Test in Europe Conference & Exhibition, 2009

Y2 - 20 April 2009 through 24 April 2009

ER -

Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits

Conference

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