Importance of spontaneous emission noise in dynamic jitter in monolithic mode-locked diode lasers

Atef M. Rashed, Adrian Wonfor, Benyuan Zhu, Richard V. Penty, Ian H. White

Research output: Contribution to journalConference article

Abstract

The operation of a monolithic 5-quantum well, 4-section mode locked semiconductor laser with an integrated distributed Bragg reflector (DBR), which generates 10 ps optical pulses at repetition rate of 10 GHz at a wavelength of 1.55 μm, is investigated. The device is simulated using complete travelling wave model which includes spontaneous and shot noise sources and uses gain parameters independently verified form band calculation models. The jitter is calculated at different delay values. The different contributions to jitter in the laser within the model indicates that spontaneous emission is the dominant cause. The final jitter value and the time constant are investigated.

Original languageEnglish
Pages (from-to)211-212
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
Publication statusPublished - 1 Dec 1997
EventProceedings of the 1997 10th IEEE Lasers and Electro-Optics Society Annual Meeting, LEOS. Part 2 (of 2) - San Francisco, CA, USA
Duration: 10 Nov 199713 Nov 1997

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

Cite this

Importance of spontaneous emission noise in dynamic jitter in monolithic mode-locked diode lasers. / Rashed, Atef M.; Wonfor, Adrian; Zhu, Benyuan; Penty, Richard V.; White, Ian H.

In: Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Vol. 2, 01.12.1997, p. 211-212.

Research output: Contribution to journalConference article

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AB - The operation of a monolithic 5-quantum well, 4-section mode locked semiconductor laser with an integrated distributed Bragg reflector (DBR), which generates 10 ps optical pulses at repetition rate of 10 GHz at a wavelength of 1.55 μm, is investigated. The device is simulated using complete travelling wave model which includes spontaneous and shot noise sources and uses gain parameters independently verified form band calculation models. The jitter is calculated at different delay values. The different contributions to jitter in the laser within the model indicates that spontaneous emission is the dominant cause. The final jitter value and the time constant are investigated.

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