Imaging of morphological changes and phase segregation in doped polymeric semiconductors

Felix Deschler, Daniel Riedel, Andras Deák, Bernhard Ecker, Elizabeth Von Hauff, Enrico Da Como

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

LanguageEnglish
Pages381-387
Number of pages7
JournalSynthetic Metals
Volume199
Early online date18 Dec 2014
DOIs
StatusPublished - Jan 2015

Fingerprint

Conjugated polymers
Semiconductor materials
Imaging techniques
Scanning electron microscopy
scanning electron microscopy
polymers
Doping (additives)
Transmission electron microscopy
transmission electron microscopy
electrical resistivity
Polymer films
Surface morphology
saturation
Thin films
Electrons
Monitoring
electrons
tetracyanoquinodimethane
Electric Conductivity
poly(2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta(2,1-b-3,4-b0)dithiophene))-alt-4,7-(2,1,3-benzothiadiazole)

Keywords

  • Conjugated polymer
  • Donor acceptor
  • Doping
  • Electron microscopy
  • TCNQ

Cite this

Imaging of morphological changes and phase segregation in doped polymeric semiconductors. / Deschler, Felix; Riedel, Daniel; Deák, Andras; Ecker, Bernhard; Von Hauff, Elizabeth; Da Como, Enrico.

In: Synthetic Metals, Vol. 199, 01.2015, p. 381-387.

Research output: Contribution to journalArticle

Deschler, Felix ; Riedel, Daniel ; Deák, Andras ; Ecker, Bernhard ; Von Hauff, Elizabeth ; Da Como, Enrico. / Imaging of morphological changes and phase segregation in doped polymeric semiconductors. In: Synthetic Metals. 2015 ; Vol. 199. pp. 381-387.
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