Imaging of morphological changes and phase segregation in doped polymeric semiconductors

Felix Deschler; Daniel Riedel; Andras Deák; Bernhard Ecker; Elizabeth Von Hauff; Enrico Da Como

doi:10.1016/j.synthmet.2014.11.037

Imaging of morphological changes and phase segregation in doped polymeric semiconductors

Felix Deschler, Daniel Riedel, Andras Deák, Bernhard Ecker, Elizabeth Von Hauff, Enrico Da Como

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Abstract

The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

Original language	English
Pages (from-to)	381-387
Number of pages	7
Journal	Synthetic Metals
Volume	199
Early online date	18 Dec 2014
DOIs	https://doi.org/10.1016/j.synthmet.2014.11.037
Publication status	Published - Jan 2015

Keywords

Conjugated polymer
Donor acceptor
Doping
Electron microscopy
TCNQ

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10.1016/j.synthmet.2014.11.037

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Published version available via: http://dx.doi.org/10.1016/j.synthmet.2014.11.037
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Cite this

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title = "Imaging of morphological changes and phase segregation in doped polymeric semiconductors",

abstract = "The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.",

keywords = "Conjugated polymer, Donor acceptor, Doping, Electron microscopy, TCNQ",

author = "Felix Deschler and Daniel Riedel and Andras De{\'a}k and Bernhard Ecker and {Von Hauff}, Elizabeth and {Da Como}, Enrico",

year = "2015",

month = jan,

doi = "10.1016/j.synthmet.2014.11.037",

language = "English",

volume = "199",

pages = "381--387",

journal = "Synthetic Metals",

issn = "0379-6779",

publisher = "Elsevier",

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TY - JOUR

T1 - Imaging of morphological changes and phase segregation in doped polymeric semiconductors

AU - Deschler, Felix

AU - Riedel, Daniel

AU - Deák, Andras

AU - Ecker, Bernhard

AU - Von Hauff, Elizabeth

AU - Da Como, Enrico

PY - 2015/1

Y1 - 2015/1

N2 - The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

AB - The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

KW - Conjugated polymer

KW - Donor acceptor

KW - Doping

KW - Electron microscopy

KW - TCNQ

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U2 - 10.1016/j.synthmet.2014.11.037

DO - 10.1016/j.synthmet.2014.11.037

M3 - Article

AN - SCOPUS:84919684491

SN - 0379-6779

VL - 199

SP - 381

EP - 387

JO - Synthetic Metals

JF - Synthetic Metals

ER -

Imaging of morphological changes and phase segregation in doped polymeric semiconductors

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Enrico Da Como

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Imaging of morphological changes and phase segregation in doped polymeric semiconductors

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Enrico Da Como

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