Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

Kyoichi Suzuki, Kiyoshi Kanisawa, Simon Perraud, Mineo Ueki, Kei Takashina, Yoshiro Hirayama

Research output: Contribution to journalArticle

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)2618-2621
JournalJapanese Journal of Applied Physics
Volume46
Issue numberPart 1, 4B
DOIs
Publication statusPublished - 24 Apr 2007

Cite this

Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy. / Suzuki, Kyoichi; Kanisawa, Kiyoshi; Perraud, Simon; Ueki, Mineo; Takashina, Kei; Hirayama, Yoshiro.

In: Japanese Journal of Applied Physics, Vol. 46, No. Part 1, 4B, 24.04.2007, p. 2618-2621.

Research output: Contribution to journalArticle

Suzuki, Kyoichi ; Kanisawa, Kiyoshi ; Perraud, Simon ; Ueki, Mineo ; Takashina, Kei ; Hirayama, Yoshiro. / Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy. In: Japanese Journal of Applied Physics. 2007 ; Vol. 46, No. Part 1, 4B. pp. 2618-2621.
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AU - Takashina, Kei

AU - Hirayama, Yoshiro

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