Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

Kyoichi Suzuki; Kiyoshi Kanisawa; Simon Perraud; Mineo Ueki; Kei Takashina; Yoshiro Hirayama

doi:10.1143/JJAP.46.2618

Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

Kyoichi Suzuki, Kiyoshi Kanisawa, Simon Perraud, Mineo Ueki, Kei Takashina, Yoshiro Hirayama

Department of Physics

Research output: Contribution to journal › Article › peer-review

5 Citations (SciVal)

Original language	English
Pages (from-to)	2618-2621
Journal	Japanese Journal of Applied Physics
Volume	46
Issue number	Part 1, 4B
DOIs	https://doi.org/10.1143/JJAP.46.2618
Publication status	Published - 24 Apr 2007

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10.1143/JJAP.46.2618

http://dx.doi.org/10.1143/JJAP.46.2618

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Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy. / Suzuki, Kyoichi; Kanisawa, Kiyoshi; Perraud, Simon et al.
In: Japanese Journal of Applied Physics, Vol. 46, No. Part 1, 4B, 24.04.2007, p. 2618-2621.

Research output: Contribution to journal › Article › peer-review

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AU - Suzuki, Kyoichi

AU - Kanisawa, Kiyoshi

AU - Perraud, Simon

AU - Ueki, Mineo

AU - Takashina, Kei

AU - Hirayama, Yoshiro

PY - 2007/4/24

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M3 - Article

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JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - Part 1, 4B

ER -

Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

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