Identification of key temperature measurement technologies for the enhancement of product and equipment integrity in the light controlled factory

David Ross-Pinnock, Paul G. Maropoulos

Research output: Contribution to journalArticle

5 Citations (Scopus)
80 Downloads (Pure)

Abstract

Thermal effects in uncontrolled factory environments are often the largest source of uncertainty in large volume dimensional metrology. As the standard temperature for metrology of 20°C cannot be achieved practically or economically in many manufacturing facilities, the characterisation and modelling of temperature offers a solution for improving the uncertainty of dimensional measurement and quantifying thermal variability in large assemblies. Technologies that currently exist for temperature measurement in the range of 0-50°C have been presented alongside discussion of these temperature measurement technologies' usefulness for monitoring temperatures in a manufacturing context. Particular aspects of production where the technology could play a role are highlighted as well as practical considerations for deployment. Contact sensors such as platinum resistance thermometers can produce accuracy closest to the desired accuracy given the most challenging measurement conditions calculated to be ∼0.02°C. Non-contact solutions would be most practical in the light controlled factory (LCF) and semi-invasive appear least useful but all technologies can play some role during the initial development of thermal variability models.

Original languageEnglish
Pages (from-to)114-121
Number of pages8
JournalProcedia CIRP
Volume25
Issue numberC
DOIs
Publication statusPublished - 2014
Event8th International Conference on Digital Enterprise Technology (DET), 2014 - Stuttgart, Germany
Duration: 25 Mar 201428 Mar 2014

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Temperature measurement
Industrial plants
Contact sensors
Thermometers
Thermal effects
Temperature
Platinum
Monitoring
Uncertainty
Hot Temperature

Keywords

  • Light controlled factory (LCF)
  • Temperature measurement
  • Thermal modelling

Cite this

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