Abstract
Anisotropically nanostructured silicon layers exhibit a strong in-plane birefringence. Their optical anisotropy parameters are found to be extremely sensitive to the presence of dielectric substances inside of the pores. Polarization-resolved transmittance measurements provide an extremely sensitive tool to analyze the adsorption of various atoms and molecules in negligible quantities. A variation of the transmitted linearly polarized light intensity up to two orders of magnitude combined with a fast optical response in the range of seconds make these layers a good candidate for sensor applications. (C) 2001 American Institute of Physics.
| Original language | English |
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| Pages (from-to) | 3529-3532 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 90 |
| Issue number | 7 |
| Publication status | Published - 2001 |