High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi, Nemai Chandra Karmakar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

Original languageEnglish
Title of host publicationAMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings
Place of PublicationU. S. A.
PublisherIEEE
Pages43-44
Number of pages2
ISBN (Electronic)9781509004294
DOIs
Publication statusPublished - 20 Oct 2016
Event2nd Australian Microwave Symposium, AMS 2016 - Adelaide, Australia
Duration: 11 Feb 201612 Feb 2016

Conference

Conference2nd Australian Microwave Symposium, AMS 2016
CountryAustralia
CityAdelaide
Period11/02/1612/02/16

Keywords

  • Chipless RFID tag
  • MEMS

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

Fingerprint Dive into the research topics of 'High quality MEMS inductors for chipless RFID in harsh environment'. Together they form a unique fingerprint.

  • Cite this

    Mohammadi, A., & Karmakar, N. C. (2016). High quality MEMS inductors for chipless RFID in harsh environment. In AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings (pp. 43-44). [7593485] IEEE. https://doi.org/10.1109/AUSMS.2016.7593485