High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi; Nemai Chandra Karmakar

doi:10.1109/AUSMS.2016.7593485

High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi, Nemai Chandra Karmakar

Department of Electronic & Electrical Engineering

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

1 Citation (SciVal)

Abstract

Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

Original language	English
Title of host publication	AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings
Place of Publication	U. S. A.
Publisher	IEEE
Pages	43-44
Number of pages	2
ISBN (Electronic)	9781509004294
DOIs	https://doi.org/10.1109/AUSMS.2016.7593485
Publication status	Published - 20 Oct 2016
Event	2nd Australian Microwave Symposium, AMS 2016 - Adelaide, Australia Duration: 11 Feb 2016 → 12 Feb 2016

Conference

Conference	2nd Australian Microwave Symposium, AMS 2016
Country/Territory	Australia
City	Adelaide
Period	11/02/16 → 12/02/16

Keywords

Chipless RFID tag
MEMS

ASJC Scopus subject areas

Computer Networks and Communications
Electrical and Electronic Engineering
Instrumentation

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10.1109/AUSMS.2016.7593485

Cite this

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title = "High quality MEMS inductors for chipless RFID in harsh environment",

abstract = "Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.",

keywords = "Chipless RFID tag, MEMS",

author = "Ali Mohammadi and Karmakar, {Nemai Chandra}",

year = "2016",

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doi = "10.1109/AUSMS.2016.7593485",

language = "English",

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booktitle = "AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings",

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N2 - Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

AB - Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

KW - Chipless RFID tag

KW - MEMS

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M3 - Chapter in a published conference proceeding

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SP - 43

EP - 44

BT - AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings

PB - IEEE

CY - U. S. A.

T2 - 2nd Australian Microwave Symposium, AMS 2016

Y2 - 11 February 2016 through 12 February 2016

ER -

High quality MEMS inductors for chipless RFID in harsh environment

Abstract

Conference

Keywords

ASJC Scopus subject areas

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