High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi, Nemai Chandra Karmakar

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

1 Citation (SciVal)


Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

Original languageEnglish
Title of host publicationAMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings
Place of PublicationU. S. A.
Number of pages2
ISBN (Electronic)9781509004294
Publication statusPublished - 20 Oct 2016
Event2nd Australian Microwave Symposium, AMS 2016 - Adelaide, Australia
Duration: 11 Feb 201612 Feb 2016


Conference2nd Australian Microwave Symposium, AMS 2016


  • Chipless RFID tag
  • MEMS

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation


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