High-quality depth up-sampling based on multi-scale SLIC

Yiguo Qiao, Licheng Jiao, Biao Hou

Research output: Contribution to journalLetter

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Original languageEnglish
Article number8345115
Pages (from-to)494-496
Number of pages3
JournalElectronics Letters
Volume54
Issue number8
DOIs
Publication statusPublished - 19 Apr 2018

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