High-quality depth up-sampling based on multi-scale SLIC

Yiguo Qiao, Licheng Jiao, Biao Hou

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@article{a575276c6f55447680e67f3ff7775ea7,

title = "High-quality depth up-sampling based on multi-scale SLIC",

author = "Yiguo Qiao and Licheng Jiao and Biao Hou",

year = "2018",

month = apr,

day = "19",

doi = "10.1049/el.2017.4393",

language = "English",

volume = "54",

pages = "494--496",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "John Wiley & Sons",

number = "8",

}