High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model

J Jamshidi; A R Mileham; G W Owen

High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model

J Jamshidi, A R Mileham, G W Owen

Department of Mechanical Engineering

Research output: Contribution to conference › Paper

2 Citations (SciVal)

Original language	English
Pages	DETC2006-99581
Publication status	Published - 2006
Event	Proc International ASME Design Engineering Technical Conference & Computers and Information in Engineering Conference (IDETC/CIE2006) - Philadelphia USA Duration: 1 Jan 2006 → …

Conference

Conference	Proc International ASME Design Engineering Technical Conference & Computers and Information in Engineering Conference (IDETC/CIE2006)
City	Philadelphia USA
Period	1/01/06 → …

Cite this

High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model. / Jamshidi, J; Mileham, A R; Owen, G W.
2006. DETC2006-99581 Paper presented at Proc International ASME Design Engineering Technical Conference & Computers and Information in Engineering Conference (IDETC/CIE2006), Philadelphia USA.

Research output: Contribution to conference › Paper

@conference{8b5951d8918f4e84a9765cb44a97a773,

title = "High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model",

author = "J Jamshidi and Mileham, \{A R\} and Owen, \{G W\}",

year = "2006",

language = "English",

pages = "DETC2006--99581",

note = "Proc International ASME Design Engineering Technical Conference \& Computers and Information in Engineering Conference (IDETC/CIE2006) ; Conference date: 01-01-2006",

}

TY - CONF

T1 - High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model

AU - Jamshidi, J

AU - Mileham, A R

AU - Owen, G W

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/33751311815

M3 - Paper

SP - DETC2006-99581

T2 - Proc International ASME Design Engineering Technical Conference & Computers and Information in Engineering Conference (IDETC/CIE2006)

Y2 - 1 January 2006

ER -

High accuracy laser scanned view registration method for reverse engineering using a CMM generated CAD model

Conference

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Cite this