| Original language | English |
|---|---|
| Title of host publication | Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: the system on chip approach |
| Editors | Y Sun |
| Publisher | IET |
| Pages | 113-139 |
| Number of pages | 27 |
| ISBN (Print) | 978-0-86341-745-0 |
| Publication status | Published - 2008 |
Hierarchical/decomposition techniques for large-scale analogue diagnosis
Peter R Shepherd
Research output: Chapter or section in a book/report/conference proceeding › Book chapter